Application of wavelength dispersive X-ray spectroscopy in by Matjaž Kavčič

By Matjaž Kavčič

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The width of each shaped pulse is equal to Td + Tp, wherein Tp is the peaking time of the related preamplifier output pulse. Our DPP method is characterized by two shaping modes: a fast SDL shaping mode and a slow SDL shaping mode, operating at different delay times. The “fast” shaping operation, characterized by a short delay time Td, fast, is optimized to detect the pulses and to provide a High Resolution X–Ray Spectroscopy with Compound Semiconductor Detectors and Digital Pulse Processing Systems 47 pile-up inspection.

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